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1 Ergebnisse
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Comparison of supply noise and substrate noise reduction in..:
, In:
2009 10th International Symposium on Quality Electronic Design
,
Cheong, Wai Leng
;
Owens, Brian
;
Pham, Hui En
... - p. None , 2009
Link:
https://doi.org/10.1109/ISQED.2009.4810279
RT T1 <cTitle>2009 10th International Symposium on Quality Electronic Design</cTitle>: T1 <Title>Comparison of supply noise and substrate noise reduction in SiGe BiCMOS and FDSOI processes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-4810279&Exemplar=1&LAN=DE A1 Cheong, Wai Leng A1 Owens, Brian A1 Pham, Hui En A1 Hanken, Christopher A1 Le, Jim A1 Fiez, Terri A1 Mayaram, Kartikeya YR 2009 SN 1948-3287 SN 1948-3295 K1 Noise reduction K1 Silicon germanium K1 Germanium silicon alloys K1 BiCMOS integrated circuits K1 Crosstalk K1 Circuit noise K1 Circuit testing K1 Silicon on insulator technology K1 Integrated circuit noise K1 Coupling circuits K1 substrate noise K1 SOI K1 SiGe BiCMOS K1 substrate noise comparison K1 noise reduction SP None LK http://dx.doi.org/https://doi.org/10.1109/ISQED.2009.4810279 DO https://doi.org/10.1109/ISQED.2009.4810279 SF ELIB - SuUB Bremen
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