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1 Ergebnisse
1
Failure Analysis on the Chip Capacitor:
, In:
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis
,
Wang, Yang
;
He, Wei
;
Mo, Yunqi
... - p. None , 2009
Link:
https://doi.org/10.1109/CAS-ICTD.2009.4960818
RT T1
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis
: T1
Failure Analysis on the Chip Capacitor
UL https://suche.suub.uni-bremen.de/peid=ieee-4960818&Exemplar=1&LAN=DE A1 Wang, Yang A1 He, Wei A1 Mo, Yunqi A1 Wang, Shou-Xu A1 Wu, Xiang-Hao A1 He, Bo A1 Zhang, Xuan-Dong YR 2009 SN 2324-8475 SN 2324-8491 K1 Failure analysis K1 Capacitors K1 Inspection K1 Ceramics K1 Dielectric materials K1 Electrodes K1 Nonhomogeneous media K1 Semiconductor device manufacture K1 Quality control K1 Manufacturing processes SP None LK http://dx.doi.org/https://doi.org/10.1109/CAS-ICTD.2009.4960818 DO https://doi.org/10.1109/CAS-ICTD.2009.4960818 SF ELIB - SuUB Bremen
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