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1 Ergebnisse
1
Searching Failure Distribution of Sample Based on Slope-Mod..:
, In:
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis
,
Luo, Hang
;
Wang, Hou-Jun
;
Long, Bing
. - p. None , 2009
Link:
https://doi.org/10.1109/CAS-ICTD.2009.4960869
RT T1
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis
: T1
Searching Failure Distribution of Sample Based on Slope-Mode Distance
UL https://suche.suub.uni-bremen.de/peid=ieee-4960869&Exemplar=1&LAN=DE A1 Luo, Hang A1 Wang, Hou-Jun A1 Long, Bing A1 Huang, Jian-Guo YR 2009 SN 2324-8475 SN 2324-8491 K1 Testing K1 Failure analysis K1 Reliability engineering K1 Shape K1 Automation K1 Educational institutions K1 Discrete wavelet transforms K1 Data mining K1 Yarn K1 Optimization methods SP None LK http://dx.doi.org/https://doi.org/10.1109/CAS-ICTD.2009.4960869 DO https://doi.org/10.1109/CAS-ICTD.2009.4960869 SF ELIB - SuUB Bremen
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