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1 Ergebnisse
1
Measurement of contact resistance distribution using a 4k c..:
, In:
Proceedings International Conference on Microelectronic Test Structures
,
Hamamoto, T.
;
Ozaki, T.
;
Aoki, M.
. - p. 57,58,59,60,61 , 1995
Link:
https://doi.org/10.1109/ICMTS.1995.513945
RT T1
Proceedings International Conference on Microelectronic Test Structures
: T1
Measurement of contact resistance distribution using a 4k contacts array
UL https://suche.suub.uni-bremen.de/peid=ieee-513945&Exemplar=1&LAN=DE A1 Hamamoto, T. A1 Ozaki, T. A1 Aoki, M. A1 Ishibashi, Y. YR 1995 K1 Electrical resistance measurement K1 Contact resistance K1 Testing K1 MOSFETs K1 Ultra large scale integration K1 Counting circuits K1 Decoding K1 Gaussian distribution K1 Fluctuations K1 Tin SP 57,58,59,60,61 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS.1995.513945 DO https://doi.org/10.1109/ICMTS.1995.513945 SF ELIB - SuUB Bremen
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