I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Measurement of contact resistance distribution using a 4k c..:

, In: Proceedings International Conference on Microelectronic Test Structures,
Hamamoto, T. ; Ozaki, T. ; Aoki, M.. - p. 57,58,59,60,61 , 1995
Link: https://doi.org/10.1109/ICMTS.1995.513945