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1 Ergebnisse
1
Self-excited measurment of CVT and its error analysis:
, In:
2008 China International Conference on Electricity Distribution
,
Li, Tao
;
Du, Xiao-ping
;
Zhu, Jian-sheng
... - p. None , 2008
Link:
https://doi.org/10.1109/CICED.2008.5211749
RT T1 <cTitle>2008 China International Conference on Electricity Distribution</cTitle>: T1 <Title>Self-excited measurment of CVT and its error analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-5211749&Exemplar=1&LAN=DE A1 Li, Tao A1 Du, Xiao-ping A1 Zhu, Jian-sheng A1 Liu, Huang-guang A1 Li, Jing-hua A1 Niu, Qing-song YR 2008 SN 2161-7481 SN 2161-749X K1 Error analysis K1 Circuit testing K1 Capacitance measurement K1 Voltage transformers K1 Power measurement K1 Bridge circuits K1 Dielectric measurements K1 Dielectric losses K1 Frequency K1 Automatic testing K1 Capactive Voltage Transformer (CVT) K1 self-excited method K1 error analysis K1 partial-voltage capacitance K1 dielectric loss (tan δ) SP None LK http://dx.doi.org/https://doi.org/10.1109/CICED.2008.5211749 DO https://doi.org/10.1109/CICED.2008.5211749 SF ELIB - SuUB Bremen
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