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1 Ergebnisse
1
A Low-Cost FPGA-Based Test and Diagnosis Architecture for S..:
, In:
2009 First International Conference on Advances in System Testing and Validation Lifecycle
,
Di Carlo, Stefano
;
Prinetto, Paolo
;
Scionti, Alberto
... - p. None , 2009
Link:
https://doi.org/10.1109/VALID.2009.29
RT T1
2009 First International Conference on Advances in System Testing and Validation Lifecycle
: T1
A Low-Cost FPGA-Based Test and Diagnosis Architecture for SRAMs
UL https://suche.suub.uni-bremen.de/peid=ieee-5279391&Exemplar=1&LAN=DE A1 Di Carlo, Stefano A1 Prinetto, Paolo A1 Scionti, Alberto A1 Figueras, Joan A1 Manich, Salvador A1 Rodriguez-Montanes, Rosa YR 2009 K1 Circuit testing K1 Fault diagnosis K1 Circuit faults K1 System testing K1 Costs K1 Microprocessors K1 Integrated circuit testing K1 Computer aided manufacturing K1 SRAM chips K1 Field programmable gate arrays K1 Memory Diagnosis K1 Memory Testing K1 March Test SP None LK http://dx.doi.org/https://doi.org/10.1109/VALID.2009.29 DO https://doi.org/10.1109/VALID.2009.29 SF ELIB - SuUB Bremen
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