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1 Ergebnisse
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Analysis of sense margin and reliability of 1T-DRAM fabrica..:
, In:
2009 IEEE International SOI Conference
,
Collaert, N.
;
Aoulaiche, M.
;
Rakowski, M.
... - p. None , 2009
Link:
https://doi.org/10.1109/SOI.2009.5318781
RT T1
2009 IEEE International SOI Conference
: T1
Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates
UL https://suche.suub.uni-bremen.de/peid=ieee-5318781&Exemplar=1&LAN=DE A1 Collaert, N. A1 Aoulaiche, M. A1 Rakowski, M. A1 De Wachter, B. A1 Bourdelle, K. A1 Nguyen, B.-Y. A1 Boedta, F. A1 Delprat, D. A1 Jurczak, M. YR 2009 SN 1078-621X K1 Transistors K1 Substrates K1 Degradation K1 Stress K1 Hot carriers K1 Charge carrier processes K1 Electrons K1 Read-write memory K1 Random access memory K1 Impact ionization SP None LK http://dx.doi.org/https://doi.org/10.1109/SOI.2009.5318781 DO https://doi.org/10.1109/SOI.2009.5318781 SF ELIB - SuUB Bremen
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