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1 Ergebnisse
1
Characterization of DAF tape for embedded micro wafer level..:
, In:
2009 11th Electronics Packaging Technology Conference
,
Pei-Siang, Sharon Lim
;
Sharma, Gaurav
;
Kumar, Aditya
.. - p. None , 2009
Link:
https://doi.org/10.1109/EPTC.2009.5416548
RT T1
2009 11th Electronics Packaging Technology Conference
: T1
Characterization of DAF tape for embedded micro wafer level packaging
UL https://suche.suub.uni-bremen.de/peid=ieee-5416548&Exemplar=1&LAN=DE A1 Pei-Siang, Sharon Lim A1 Sharma, Gaurav A1 Kumar, Aditya A1 Rao, Vempati Srinivasa A1 Sheng, Vincent Lee Wen YR 2009 K1 Wafer scale integration K1 Microassembly K1 Wafer bonding K1 Electronics packaging K1 Assembly K1 Materials testing K1 Industrial electronics K1 Electronics industry K1 Costs K1 Mobile handsets SP None LK http://dx.doi.org/https://doi.org/10.1109/EPTC.2009.5416548 DO https://doi.org/10.1109/EPTC.2009.5416548 SF ELIB - SuUB Bremen
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