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1 Ergebnisse
1
Resilient design in scaled CMOS for energy efficiency:
, In:
2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)
,
Tschanz, James
;
Bowman, Keith
;
Khellah, Muhammad
... - p. None , 2010
Link:
https://doi.org/10.1109/ASPDAC.2010.5419812
RT T1
2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)
: T1
Resilient design in scaled CMOS for energy efficiency
UL https://suche.suub.uni-bremen.de/peid=ieee-5419812&Exemplar=1&LAN=DE A1 Tschanz, James A1 Bowman, Keith A1 Khellah, Muhammad A1 Wilkerson, Chris A1 Geuskens, Bibiche A1 Somasekhar, Dinesh A1 Raychowdhury, Arijit A1 Kulkarni, Jaydeep A1 Tokunaga, Carlos A1 Shih-Lien Lu A1 Karnik, Tanay A1 De, Vivek YR 2010 SN 2153-6961 SN 2153-697X K1 Energy efficiency K1 Degradation K1 Voltage K1 CMOS technology K1 Process design K1 Signal design K1 Error-free operation K1 Manufacturing processes K1 Stress control K1 Temperature control SP None LK http://dx.doi.org/https://doi.org/10.1109/ASPDAC.2010.5419812 DO https://doi.org/10.1109/ASPDAC.2010.5419812 SF ELIB - SuUB Bremen
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