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1 Ergebnisse
1
Interconnect delay and slew metrics using the extreme value..:
, In:
2010 11th International Symposium on Quality Electronic Design (ISQED)
,
Zeng, Jun-Kuei
;
Chen, Chung-Ping
- p. None , 2010
Link:
https://doi.org/10.1109/ISQED.2010.5450483
RT T1
2010 11th International Symposium on Quality Electronic Design (ISQED)
: T1
Interconnect delay and slew metrics using the extreme value distribution
UL https://suche.suub.uni-bremen.de/peid=ieee-5450483&Exemplar=1&LAN=DE A1 Zeng, Jun-Kuei A1 Chen, Chung-Ping YR 2010 SN 1948-3295 SN 1948-3287 SN 1948-3287 K1 Integrated circuit interconnections K1 Delay effects K1 Table lookup K1 Integrated circuit technology K1 Integrated circuit synthesis K1 Weibull distribution K1 Circuit topology K1 Electric resistance K1 Circuit analysis computing K1 Distributed computing K1 Interconnect K1 Extreme Value Distribution K1 Delay K1 Slew K1 Statistical SP None LK http://dx.doi.org/https://doi.org/10.1109/ISQED.2010.5450483 DO https://doi.org/10.1109/ISQED.2010.5450483 SF ELIB - SuUB Bremen
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