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1 Ergebnisse
1
Interconnect delay and slew metrics using the beta distribu..:
, In:
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)
,
Zeng, Jun-Kuei
;
Chen, Chung-Ping
- p. 1329-1332 , 2010
Link:
https://doi.org/10.1109/DATE.2010.5457014
RT T1
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)
: T1
Interconnect delay and slew metrics using the beta distribution
UL https://suche.suub.uni-bremen.de/peid=ieee-5457014&Exemplar=1&LAN=DE A1 Zeng, Jun-Kuei A1 Chen, Chung-Ping YR 2010 SN 1558-1101 SN 1530-1591 SN 1530-1591 K1 Delay K1 Integrated circuit interconnections K1 Table lookup K1 Probability density function K1 Electric resistance K1 Integrated circuit technology K1 Computational modeling K1 Integrated circuit modeling K1 SPICE K1 Physics computing SP 1329 OP 1332 LK http://dx.doi.org/https://doi.org/10.1109/DATE.2010.5457014 DO https://doi.org/10.1109/DATE.2010.5457014 SF ELIB - SuUB Bremen
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