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Electrical characterization of novel PMNT thin-films:

, In: 2010 International Conference on Microelectronic Test Structures (ICMTS),
Chen, Wenbin ; McCarthy, Kevin G. ; Copuroglu, Mehmet... - p. 98-101 , 2010
Link: https://doi.org/10.1109/ICMTS.2010.5466848