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1 Ergebnisse
1
Soft Errors in Static NMOS RAMs:
, In:
ESSCIRC '86: Twelfth European Solid-State Circuits Conference
,
Carter, P.M.
;
Wilkins, B.R.
- p. 13-15 , 1986
Link:
https://doi.org/10.1109/ESSCIRC.1986.5468244
RT T1 <cTitle>ESSCIRC '86: Twelfth European Solid-State Circuits Conference</cTitle>: T1 <Title>Soft Errors in Static NMOS RAMs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-5468244&Exemplar=1&LAN=DE A1 Carter, P.M. A1 Wilkins, B.R. YR 1986 K1 MOS devices K1 Random access memory K1 Error analysis K1 Voltage K1 Alpha particles K1 Circuit simulation K1 SPICE K1 Manufacturing K1 Testing K1 Particle measurements SP 13 OP 15 LK http://dx.doi.org/https://doi.org/10.1109/ESSCIRC.1986.5468244 DO https://doi.org/10.1109/ESSCIRC.1986.5468244 SF ELIB - SuUB Bremen
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