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1 Ergebnisse
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Electron Beam Observability and Controlability for the Debu..:
, In:
ESSCIRC '86: Twelfth European Solid-State Circuits Conference
,
Guiguet, I.
;
Micollet, D.
;
Laurent, J.
. - p. 181-183 , 1986
Link:
https://doi.org/10.1109/ESSCIRC.1986.5468396
RT T1
ESSCIRC '86: Twelfth European Solid-State Circuits Conference
: T1
Electron Beam Observability and Controlability for the Debugging of Integrated Circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-5468396&Exemplar=1&LAN=DE A1 Guiguet, I. A1 Micollet, D. A1 Laurent, J. A1 Courtois, B. YR 1986 K1 Electron beams K1 Observability K1 Debugging K1 Scanning electron microscopy K1 Automatic voltage control K1 Electron emission K1 Circuit testing K1 Adaptive arrays K1 Logic arrays K1 Automatic testing SP 181 OP 183 LK http://dx.doi.org/https://doi.org/10.1109/ESSCIRC.1986.5468396 DO https://doi.org/10.1109/ESSCIRC.1986.5468396 SF ELIB - SuUB Bremen
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