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DC hot carrier stress effect on CMOS 65nm 60 GHz power ampl..:

, In: 2010 IEEE Radio Frequency Integrated Circuits Symposium,
Quemerais, T. ; Moquillon, L. ; Huard, V.... - p. 351-354 , 2010
Link: https://doi.org/10.1109/RFIC.2010.5477310