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Electrical and thermal modeling of AlGaN/GaN HEMTS on diamo..:

, In: 2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop],
Mcglone, D. ; Weatherford, T. ; Gillespie, J... - p. None , 2008
Link: https://doi.org/10.1109/ROCS.2008.5483613