I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Serial interface logic built in self test methodology:

, In: 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT),
Boey, Kean Hong ; Yap, Kok Sing ; Ng, Wai Mun - p. 1-3 , 2008
Link: https://doi.org/10.1109/IEMT.2008.5507795