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1 Ergebnisse
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X-ray photoelectron spectroscopic depth profilometry of nit..:
, In:
IEEE Conference Record - Abstracts. 1996 IEEE International Conference on Plasma Science
,
Sarkissian, A.H.
;
Leblanc, J.B.
;
Paradis, E.
.. - p. 221 , 1996
Link:
https://doi.org/10.1109/PLASMA.1996.550941
RT T1
IEEE Conference Record - Abstracts. 1996 IEEE International Conference on Plasma Science
: T1
X-ray photoelectron spectroscopic depth profilometry of nitrogen implanted in materials for modification of their surface properties
UL https://suche.suub.uni-bremen.de/peid=ieee-550941&Exemplar=1&LAN=DE A1 Sarkissian, A.H. A1 Leblanc, J.B. A1 Paradis, E. A1 Paynter, R. A1 Stansfield, B.L. YR 1996 SN 0730-9244 K1 Spectroscopy K1 Nitrogen K1 Plasma measurements K1 Surface resistance K1 Ion implantation K1 Plasma immersion ion implantation K1 Plasma x-ray sources K1 Plasma simulation K1 Surface treatment K1 Plasma sources SP 221 LK http://dx.doi.org/https://doi.org/10.1109/PLASMA.1996.550941 DO https://doi.org/10.1109/PLASMA.1996.550941 SF ELIB - SuUB Bremen
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