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X-ray photoelectron spectroscopic depth profilometry of nit..:

, In: IEEE Conference Record - Abstracts. 1996 IEEE International Conference on Plasma Science,
Sarkissian, A.H. ; Leblanc, J.B. ; Paradis, E... - p. 221 , 1996
Link: https://doi.org/10.1109/PLASMA.1996.550941