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1 Ergebnisse
1
Breakdown at window interfaces caused by high power microwa..:
, In:
IEEE Conference Record - Abstracts. 1996 IEEE International Conference on Plasma Science
,
Dickens, J.C.
;
Elliott, J.
;
Hatfield, L.L.
.. - p. 230 , 1996
Link:
https://doi.org/10.1109/PLASMA.1996.551438
RT T1
IEEE Conference Record - Abstracts. 1996 IEEE International Conference on Plasma Science
: T1
Breakdown at window interfaces caused by high power microwave fields
UL https://suche.suub.uni-bremen.de/peid=ieee-551438&Exemplar=1&LAN=DE A1 Dickens, J.C. A1 Elliott, J. A1 Hatfield, L.L. A1 Kristiansen, M. A1 Krompholz, H. YR 1996 SN 0730-9244 K1 Electric breakdown K1 Plasma measurements K1 Vacuum breakdown K1 Geometry K1 Magnetic field measurement K1 Atmospheric waves K1 Testing K1 Magnetic resonance K1 Couplings K1 Dielectrics SP 230 LK http://dx.doi.org/https://doi.org/10.1109/PLASMA.1996.551438 DO https://doi.org/10.1109/PLASMA.1996.551438 SF ELIB - SuUB Bremen
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