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Microwave-induced electromigration in multicomponent metall..:

, In: 2010 IEEE MTT-S International Microwave Symposium,
Vaucher, S. ; Bernau, L. ; Stir, M.... - p. 1-1 , 2010
Link: https://doi.org/10.1109/MWSYM.2010.5516111