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1 Ergebnisse
1
Large-signal FET model with multiple time scale dynamics fr..:
, In:
2010 IEEE MTT-S International Microwave Symposium
,
Xu, J.
;
Horn, J.
;
Iwamoto, M.
. - p. 1-1 , 2010
Link:
https://doi.org/10.1109/MWSYM.2010.5517255
RT T1
2010 IEEE MTT-S International Microwave Symposium
: T1
Large-signal FET model with multiple time scale dynamics from nonlinear vector network analyzer data
UL https://suche.suub.uni-bremen.de/peid=ieee-5517255&Exemplar=1&LAN=DE A1 Xu, J. A1 Horn, J. A1 Iwamoto, M. A1 Root, D. E. YR 2010 SN 0149-645X SN 0149-645X SN 0149-645X K1 FETs K1 Data analysis K1 Gallium arsenide K1 Gallium nitride K1 Tuners K1 Temperature dependence K1 Voltage K1 Artificial neural networks K1 Nonlinear circuits K1 Circuit simulation SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/MWSYM.2010.5517255 DO https://doi.org/10.1109/MWSYM.2010.5517255 SF ELIB - SuUB Bremen
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