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1 Ergebnisse
1
Dynamic variation monitor for measuring the impact of volta..:
, In:
IEEE Custom Integrated Circuits Conference 2010
,
Bowman, Keith
;
Tokunaga, Carlos
;
Tschanz, James
... - p. 1-4 , 2010
Link:
https://doi.org/10.1109/CICC.2010.5617415
RT T1
IEEE Custom Integrated Circuits Conference 2010
: T1
Dynamic variation monitor for measuring the impact of voltage droops on microprocessor clock frequency
UL https://suche.suub.uni-bremen.de/peid=ieee-5617415&Exemplar=1&LAN=DE A1 Bowman, Keith A1 Tokunaga, Carlos A1 Tschanz, James A1 Raychowdhury, Arijit A1 Khellah, Muhammad A1 Geuskens, Bibiche A1 Shih-Lien Lu A1 Aseron, Paolo A1 Karnik, Tanay A1 De, Vivek YR 2010 SN 2152-3630 SN 0886-5930 SN 0886-5930 K1 Microprocessors K1 Clocks K1 Frequency measurement K1 Temperature measurement K1 Monitoring K1 Temperature sensors K1 Delay SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/CICC.2010.5617415 DO https://doi.org/10.1109/CICC.2010.5617415 SF ELIB - SuUB Bremen
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