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1 Ergebnisse
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ESD robustness of FDSOI gated diode for ESD network design:..:
, In:
2010 IEEE International SOI Conference (SOI)
,
Benoist, Thomas
;
Fenouillet-Beranger, Claire
;
Perreau, Pierre
... - p. 1-2 , 2010
Link:
https://doi.org/10.1109/SOI.2010.5641372
RT T1
2010 IEEE International SOI Conference (SOI)
: T1
ESD robustness of FDSOI gated diode for ESD network design: Thin or thick BOX?
UL https://suche.suub.uni-bremen.de/peid=ieee-5641372&Exemplar=1&LAN=DE A1 Benoist, Thomas A1 Fenouillet-Beranger, Claire A1 Perreau, Pierre A1 Buj, Christel A1 Galy, Philippe A1 Marin-Cudraz, David A1 Faynot, Olivier A1 Cristoloveanu, Sorin A1 Gentil, Pierre YR 2010 SN 1078-621X SN 1078-621X K1 Logic gates K1 Electrostatic discharge K1 Robustness K1 Temperature measurement K1 Voltage measurement K1 Transmission line measurements SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/SOI.2010.5641372 DO https://doi.org/10.1109/SOI.2010.5641372 SF ELIB - SuUB Bremen
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