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1 Ergebnisse
1
Fabrication and electronic characterization of epitaxial Gd..:
, In:
2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology
,
Zhang, Xinqiang
;
Tu, Hailing
;
Wang, Xiaona
... - p. 1036-1038 , 2010
Link:
https://doi.org/10.1109/ICSICT.2010.5667533
RT T1
2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology
: T1
Fabrication and electronic characterization of epitaxial Gd2O3-doped HfO2 dielectrics on Si
UL https://suche.suub.uni-bremen.de/peid=ieee-5667533&Exemplar=1&LAN=DE A1 Zhang, Xinqiang A1 Tu, Hailing A1 Wang, Xiaona A1 Yang, Mengmeng A1 Xiong, Yuhua A1 Wang, Lei A1 Du, Jun YR 2010 K1 Silicon K1 Epitaxial growth K1 Substrates K1 High K dielectric materials K1 Surface treatment K1 Dielectrics K1 high k K1 HfO2 K1 Gd2O3 K1 epitaxial growth K1 PLD SP 1036 OP 1038 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT.2010.5667533 DO https://doi.org/10.1109/ICSICT.2010.5667533 SF ELIB - SuUB Bremen
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