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Notice of Violation of IEEE Publication Principles: Test St..:

, In: 2011 Third International Conference on Measuring Technology and Mechatronics Automation,
Jianxun, Chen ; Yongzhong, Huang ; Shaozhong, Guo.. - p. 652-655 , 2011
Link: https://doi.org/10.1109/ICMTMA.2011.734