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1 Ergebnisse
1
Test control of TAM-bus: a solution for testing SoC:
, In:
ASIC, 2003. Proceedings. 5th International Conference on
,
Wang Yong-sheng, Wang Yong-sheng
;
Xiao Li-yi, Xiao Li-yi
;
Wang Jin-xiang, Wang Jin-xiang
. - p. None , 2003
Link:
https://doi.org/10.1109/ICASIC.2003.1277411
RT T1
ASIC, 2003. Proceedings. 5th International Conference on
: T1
Test control of TAM-bus: a solution for testing SoC
UL https://suche.suub.uni-bremen.de/peid=ieee-5733599&Exemplar=1&LAN=DE A1 Wang Yong-sheng, Wang Yong-sheng A1 Xiao Li-yi, Xiao Li-yi A1 Wang Jin-xiang, Wang Jin-xiang A1 Ye Yi-zheng, Ye Yi-zheng YR 2003 SN 1523-553X K1 IEEE standards K1 automatic testing K1 integrated circuit testing K1 system-on-chip K1 CTL K1 IEEE P1500 K1 IP cores K1 P1500 compliant K1 SECT K1 SoC integrator K1 SoC testing K1 TAM control module K1 TAM controller K1 TAM-bus K1 TAP K1 chip level JTAG K1 core test language K1 core wrapper K1 hardware overhead K1 reusable embedded IP K1 standard for embedded core test K1 standard-under-development K1 test access mechanism K1 test access port K1 test architecture K1 test control K1 test coverage SP None LK http://dx.doi.org/https://doi.org/10.1109/ICASIC.2003.1277411 DO https://doi.org/10.1109/ICASIC.2003.1277411 SF ELIB - SuUB Bremen
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