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1 Ergebnisse
1
A low power BIST TPG design:
, In:
ASIC, 2003. Proceedings. 5th International Conference on
,
He Ronghui, He Ronghui
;
Li Xiaowei, Li Xiaowei
;
Gong Yunzhan, Gong Yunzhan
- p. None , 2003
Link:
https://doi.org/10.1109/ICASIC.2003.1277414
RT T1
ASIC, 2003. Proceedings. 5th International Conference on
: T1
A low power BIST TPG design
UL https://suche.suub.uni-bremen.de/peid=ieee-5733602&Exemplar=1&LAN=DE A1 He Ronghui, He Ronghui A1 Li Xiaowei, Li Xiaowei A1 Gong Yunzhan, Gong Yunzhan YR 2003 SN 1523-553X K1 automatic test pattern generation K1 built-in self test K1 fault diagnosis K1 integrated circuit testing K1 low-power electronics K1 BIST K1 LFSR K1 TPG K1 WSA K1 benchmark circuits K1 built-in self-test K1 low power design K1 stuck-at fault coverage K1 test pattern generation K1 weighted switching activity SP None LK http://dx.doi.org/https://doi.org/10.1109/ICASIC.2003.1277414 DO https://doi.org/10.1109/ICASIC.2003.1277414 SF ELIB - SuUB Bremen
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