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1 Ergebnisse
1
Advanced topics of DFT technologies in a general purposed C..:
, In:
ASIC, 2003. Proceedings. 5th International Conference on
,
Yongjun Xu, Yongjun Xu
;
Tao Lv, Tao Lv
;
Wei Lu, Wei Lu
... - p. None , 2003
Link:
https://doi.org/10.1109/ICASIC.2003.1277424
RT T1
ASIC, 2003. Proceedings. 5th International Conference on
: T1
Advanced topics of DFT technologies in a general purposed CPU chip
UL https://suche.suub.uni-bremen.de/peid=ieee-5733612&Exemplar=1&LAN=DE A1 Yongjun Xu, Yongjun Xu A1 Tao Lv, Tao Lv A1 Wei Lu, Wei Lu A1 Xiutao Yang, Xiutao Yang A1 Huawei Li, Huawei Li A1 Xiaowei Li, Xiaowei Li YR 2003 SN 1523-553X K1 boundary scan testing K1 built-in self test K1 design for testability K1 logic testing K1 microprocessor chips K1 BSD K1 DFT scheme K1 DFT technologies K1 IEEE Std. 1149.1-compatible K1 LBIST K1 MBIST K1 boundary scan design K1 design-for-testability K1 digital circuit designs K1 general-purpose CPU chip K1 high fault coverage K1 integrated circuit design K1 internal scan design K1 logic BIST K1 memory built-in-self-test K1 signal controllability K1 signal observability K1 test logics K1 test mode SP None LK http://dx.doi.org/https://doi.org/10.1109/ICASIC.2003.1277424 DO https://doi.org/10.1109/ICASIC.2003.1277424 SF ELIB - SuUB Bremen
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