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1 Ergebnisse
1
A DFT and test pattern generation methodology for an ARM po..:
, In:
ASIC, 2003. Proceedings. 5th International Conference on
,
Li Rui, Li Rui
;
Ling Ming, Ling Ming
;
Xie Yongming, Xie Yongming
.. - p. None , 2003
Link:
https://doi.org/10.1109/ICASIC.2003.1277426
RT T1
ASIC, 2003. Proceedings. 5th International Conference on
: T1
A DFT and test pattern generation methodology for an ARM powered® SoC design
UL https://suche.suub.uni-bremen.de/peid=ieee-5733614&Exemplar=1&LAN=DE A1 Li Rui, Li Rui A1 Ling Ming, Ling Ming A1 Xie Yongming, Xie Yongming A1 Ren Ailing, Ren Ailing A1 Sang Weiwei, Sang Weiwei YR 2003 SN 1523-553X K1 Registers K1 Discrete Fourier transforms K1 Pins K1 Built-in self-test K1 Flip-flops K1 Merging SP None LK http://dx.doi.org/https://doi.org/10.1109/ICASIC.2003.1277426 DO https://doi.org/10.1109/ICASIC.2003.1277426 SF ELIB - SuUB Bremen
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