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1 Ergebnisse
1
IR-drop modelling for measurement circuit of MEMS-based mic..:
, In:
ASIC, 2003. Proceedings. 5th International Conference on
,
Rui Wang, Rui Wang
;
JinQing Cai, JinQing Cai
;
ZhengFeng Huang, ZhengFeng Huang
.. - p. None , 2003
Link:
https://doi.org/10.1109/ICASIC.2003.1277468
RT T1
ASIC, 2003. Proceedings. 5th International Conference on
: T1
IR-drop modelling for measurement circuit of MEMS-based micro sensors
UL https://suche.suub.uni-bremen.de/peid=ieee-5733655&Exemplar=1&LAN=DE A1 Rui Wang, Rui Wang A1 JinQing Cai, JinQing Cai A1 ZhengFeng Huang, ZhengFeng Huang A1 Yi Wang, Yi Wang A1 Haiping Sun, Haiping Sun YR 2003 SN 1523-553X K1 RLC circuits K1 integrated circuit measurement K1 microsensors K1 semiconductor device measurement K1 semiconductor device models K1 silicon K1 IR-drop modelling K1 MEMS-based micro sensors K1 RLC model K1 SNR K1 Si K1 dual T diode K1 measurement circuit K1 noise model K1 sensitivity K1 signal frequency K1 silicon capacitive sensor K1 wire parasitism SP None LK http://dx.doi.org/https://doi.org/10.1109/ICASIC.2003.1277468 DO https://doi.org/10.1109/ICASIC.2003.1277468 SF ELIB - SuUB Bremen
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