I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Current — Voltage characterization of SHI irradiated silico..:
, In:
2009 European Conference on Radiation and Its Effects on Components and Systems
,
Dinesh, C M
;
Ramani
;
Radhakrishna, M C
... - p. 73-77 , 2009
Link:
https://doi.org/10.1109/RADECS.2009.5994556
RT T1 <cTitle>2009 European Conference on Radiation and Its Effects on Components and Systems</cTitle>: T1 <Title>Current — Voltage characterization of SHI irradiated silicon bipolar power transistor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-5994556&Exemplar=1&LAN=DE A1 Dinesh, C M A1 Ramani A1 Radhakrishna, M C A1 Madhu, K V A1 Jayashree, B A1 Khan, S A A1 Kanjilal, D YR 2009 SN 0379-6566 K1 Ions K1 Transistors K1 Silicon K1 Boron K1 Degradation K1 Radiation effects K1 Energy loss K1 Radiation Hardness K1 Linear Energy Transfer K1 Displacement Damage SP 73 OP 77 LK http://dx.doi.org/https://doi.org/10.1109/RADECS.2009.5994556 DO https://doi.org/10.1109/RADECS.2009.5994556 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
