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Properties of PZT thin films as a function of in-plane biax..:

, In: ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics,
Shepard, J.F. ; Trolier-McKinstry, S. ; Hendrickson, M.A.. - p. 161,162,163,164,165 , 1996
Link: https://doi.org/10.1109/ISAF.1996.602728