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1 Ergebnisse
1
Degradation phenomena of electrical contacts using hammerin..:
, In:
26th International Conference on Electrical Contacts (ICEC 2012)
,
Wada, Shin-ichi
;
Sawa, Koichiro
- p. 375-381 , 2012
Link:
https://doi.org/10.1049/cp.2012.0678
RT T1
26th International Conference on Electrical Contacts (ICEC 2012)
: T1
Degradation phenomena of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism — Oscillating amplitude, natural frequency and damping ratio caused by the mechanisms
UL https://suche.suub.uni-bremen.de/peid=ieee-6301923&Exemplar=1&LAN=DE A1 Wada, Shin-ichi A1 Sawa, Koichiro YR 2012 K1 electrical contact K1 degradation phenomenon K1 contact resistance K1 hammering oscillating mechanism K1 micro-sliding mechanism K1 frictional force K1 amplitude K1 natural frequency K1 damping ratio K1 relative displacemen SP 375 OP 381 LK http://dx.doi.org/https://doi.org/10.1049/cp.2012.0678 DO https://doi.org/10.1049/cp.2012.0678 SF ELIB - SuUB Bremen
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