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Capacitor dendrite failure analysis for lidless CPU testing:
, In:
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
,
Weidong, Huang
;
Changhong, Yu
;
Cimi, Cui
... - p. 1-4 , 2012
Link:
https://doi.org/10.1109/IPFA.2012.6306253
RT T1
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
: T1
Capacitor dendrite failure analysis for lidless CPU testing
UL https://suche.suub.uni-bremen.de/peid=ieee-6306253&Exemplar=1&LAN=DE A1 Weidong, Huang A1 Changhong, Yu A1 Cimi, Cui A1 Dolphin, Zuo A1 Hongwei, Guo A1 Chris, Xie A1 Majed, Anani YR 2012 SN 1946-1550 SN 1946-1542 SN 1946-1542 K1 Capacitors K1 Materials K1 Tin K1 Electrodes K1 Production K1 Humidity K1 Central Processing Unit SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA.2012.6306253 DO https://doi.org/10.1109/IPFA.2012.6306253 SF ELIB - SuUB Bremen
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