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1 Ergebnisse
1
Failure analysis of latent damage in low temperature poly-s..:
, In:
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
,
Kim, Dong-Sun
;
Lim, Chun-Bae
;
Jung, Seung-Won
... - p. 1-4 , 2012
Link:
https://doi.org/10.1109/IPFA.2012.6306314
RT T1 <cTitle>2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits</cTitle>: T1 <Title>Failure analysis of latent damage in low temperature poly-silicon TFT for OLED applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-6306314&Exemplar=1&LAN=DE A1 Kim, Dong-Sun A1 Lim, Chun-Bae A1 Jung, Seung-Won A1 Oh, Du-Seok A1 Kim, Hyung-Tae A1 Ho, Won-Joon A1 Jung, Ju-Young A1 Shim, Jong-Pil A1 Kim, Tae-Young A1 Suh, Kwang S. YR 2012 SN 1946-1550 SN 1946-1542 SN 1946-1542 K1 Electrostatic discharges K1 Logic gates K1 Organic light emitting diodes K1 Microscopy K1 Transistors K1 Lighting K1 Failure analysis SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA.2012.6306314 DO https://doi.org/10.1109/IPFA.2012.6306314 SF ELIB - SuUB Bremen
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