I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Raman measurements on GaN thin films for PV - purposes:
, In:
2012 38th IEEE Photovoltaic Specialists Conference
,
Contreras-Puente, G.
;
Cantarero, A.
;
Recio, J. M.
... - p. 000036-000038 , 2012
Link:
https://doi.org/10.1109/PVSC.2012.6317563
RT T1
2012 38th IEEE Photovoltaic Specialists Conference
: T1
Raman measurements on GaN thin films for PV - purposes
UL https://suche.suub.uni-bremen.de/peid=ieee-6317563&Exemplar=1&LAN=DE A1 Contreras-Puente, G. A1 Cantarero, A. A1 Recio, J. M. A1 de Melo, O. A1 Hernandez-Cruz, E. A1 de Moure Flores, F. A1 Mendoza-Perez, R. A1 Santana-Rodriguez, G. A1 Aguilar-Hernandez, J. A1 Lopez-Lopez, M. A1 Zamora, L. A1 Escamilla-Esquivel, A. YR 2012 SN 0160-8371 SN 0160-8371 K1 Molecular beam epitaxial growth K1 Silicon K1 Gallium nitride K1 Substrates K1 Raman scattering K1 material properties K1 semiconductor films K1 strain measurements K1 crystal microstructure K1 physical optics SP 000036 OP 000038 LK http://dx.doi.org/https://doi.org/10.1109/PVSC.2012.6317563 DO https://doi.org/10.1109/PVSC.2012.6317563 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)