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1 Ergebnisse
1
Correlation between carbon incorporation and defect formati..:
, In:
2012 38th IEEE Photovoltaic Specialists Conference
,
Tsuchiya, Yuki
;
Kusunoki, Hiroki
;
Miyazaki, Naoto
... - p. 000297-000301 , 2012
Link:
https://doi.org/10.1109/PVSC.2012.6317622
RT T1 <cTitle>2012 38th IEEE Photovoltaic Specialists Conference</cTitle>: T1 <Title>Correlation between carbon incorporation and defect formation in quasi-single crystalline silicon</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-6317622&Exemplar=1&LAN=DE A1 Tsuchiya, Yuki A1 Kusunoki, Hiroki A1 Miyazaki, Naoto A1 Sameshima, Takashi A1 Tachibana, Tomihisa A1 Kojima, Takuto A1 Arafune, Koji A1 Ohshita, Yoshio A1 Ono, Haruhiko A1 Ogura, Atsushi YR 2012 SN 0160-8371 SN 0160-8371 K1 Silicon K1 Atmospheric measurements K1 Impurities K1 Carbon K1 Atmospheric waves K1 Electronic mail K1 carbon incorporation K1 defect formation K1 precipitate K1 small-angle grain boundary K1 solar cell K1 quasi-single crystalline silicon SP 000297 OP 000301 LK http://dx.doi.org/https://doi.org/10.1109/PVSC.2012.6317622 DO https://doi.org/10.1109/PVSC.2012.6317622 SF ELIB - SuUB Bremen
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