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1 Ergebnisse
1
Heavy Ion Sensitivity of 16/32-Gbit NAND-Flash and 4-Gbit D..:
, In:
2012 IEEE Radiation Effects Data Workshop
,
Grürmann, Kai
;
Herrmann, Martin
;
Gliem, Fritz
... - p. 1-6 , 2012
Link:
https://doi.org/10.1109/REDW.2012.6353718
RT T1
2012 IEEE Radiation Effects Data Workshop
: T1
Heavy Ion Sensitivity of 16/32-Gbit NAND-Flash and 4-Gbit DDR3 SDRAM
UL https://suche.suub.uni-bremen.de/peid=ieee-6353718&Exemplar=1&LAN=DE A1 Grürmann, Kai A1 Herrmann, Martin A1 Gliem, Fritz A1 Schmidt, Hagen A1 Leibeling, Gilbert A1 Kettunen, Heikki A1 Ferlet-Cavrois, Véronique YR 2012 SN 2154-0535 SN 2154-0519 K1 SDRAM K1 Plastics K1 Silicon K1 Performance evaluation K1 Single event upset K1 Surface treatment K1 Annealing SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/REDW.2012.6353718 DO https://doi.org/10.1109/REDW.2012.6353718 SF ELIB - SuUB Bremen
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