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1 Ergebnisse
1
Novel gate-recessed vertical InAs/GaSb TFETs with record hi..:
, In:
2012 International Electron Devices Meeting
,
Zhou, Guangle
;
Kosel, T.
;
Wistey, M.
... - p. 32.6.1-32.6.4 , 2012
Link:
https://doi.org/10.1109/IEDM.2012.6479154
RT T1
2012 International Electron Devices Meeting
: T1
Novel gate-recessed vertical InAs/GaSb TFETs with record high ION of 180 μA/μm at VDS = 0.5 V
UL https://suche.suub.uni-bremen.de/peid=ieee-6479154&Exemplar=1&LAN=DE A1 Zhou, Guangle A1 Kosel, T. A1 Wistey, M. A1 Fay, P. A1 Seabaugh, A. A1 Xing, Huili A1 Li, R. A1 Vasen, T. A1 Qi, M. A1 Chae, S. A1 Lu, Y. A1 Zhang, Q. A1 Zhu, H. A1 Kuo, J.-M. YR 2012 SN 2156-017X SN 0163-1918 SN 0163-1918 K1 Logic gates K1 Passivation K1 Silicon compounds K1 Tunneling K1 Junctions K1 Transistors K1 Dielectrics SP 32.6.1 OP 32.6.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM.2012.6479154 DO https://doi.org/10.1109/IEDM.2012.6479154 SF ELIB - SuUB Bremen
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