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New Hot Carrier degradation modeling reconsidering the role..:

, In: 2013 IEEE International Reliability Physics Symposium (IRPS),
Randriamihaja, Y. Mamy ; Federspiel, X. ; Huard, V... - p. XT.1.1-XT.1.5 , 2013
Link: https://doi.org/10.1109/IRPS.2013.6532116