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1 Ergebnisse
1
Hot topic session 4A: Reliability analysis of complex digit..:
, In:
2013 IEEE 31st VLSI Test Symposium (VTS)
,
Evans, Adrian
;
Nicolaidis, Michael
;
Aitken, Rob
.. - p. 1-1 , 2013
Link:
https://doi.org/10.1109/VTS.2013.6548898
RT T1
2013 IEEE 31st VLSI Test Symposium (VTS)
: T1
Hot topic session 4A: Reliability analysis of complex digital systems
UL https://suche.suub.uni-bremen.de/peid=ieee-6548898&Exemplar=1&LAN=DE A1 Evans, Adrian A1 Nicolaidis, Michael A1 Aitken, Rob A1 Aktan, Burcin A1 Lauzeral, Olivier YR 2013 SN 1093-0167 SN 1093-0167 K1 Mobile communication K1 Integrated circuit reliability K1 Servers K1 Reliability engineering K1 Integrated circuit modeling SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/VTS.2013.6548898 DO https://doi.org/10.1109/VTS.2013.6548898 SF ELIB - SuUB Bremen
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