I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Innovative practices session 9C: Yield improvement: Challen..:
, In:
2013 IEEE 31st VLSI Test Symposium (VTS)
,
Seshadri, B.
;
Cory, B.
;
Mitra, S.
- p. 1-1 , 2013
Link:
https://doi.org/10.1109/VTS.2013.6548931
RT T1
2013 IEEE 31st VLSI Test Symposium (VTS)
: T1
Innovative practices session 9C: Yield improvement: Challenges and directions
UL https://suche.suub.uni-bremen.de/peid=ieee-6548931&Exemplar=1&LAN=DE A1 Seshadri, B. A1 Cory, B. A1 Mitra, S. YR 2013 SN 1093-0167 SN 1093-0167 K1 Abstracts K1 Monitoring K1 Manufacturing K1 Collaboration K1 Production facilities K1 Very large scale integration K1 Semiconductor device modeling SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/VTS.2013.6548931 DO https://doi.org/10.1109/VTS.2013.6548931 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)