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1 Ergebnisse
1
Tailoring of the electrical properties of silicon carbide f..:
, In:
2013 IEEE Electrical Insulation Conference (EIC)
,
Vanga-Bouanga, C.
;
Heid, T. F.
;
David, E.
.. - p. 263-266 , 2013
Link:
https://doi.org/10.1109/EIC.2013.6554246
RT T1
2013 IEEE Electrical Insulation Conference (EIC)
: T1
Tailoring of the electrical properties of silicon carbide for field grading application
UL https://suche.suub.uni-bremen.de/peid=ieee-6554246&Exemplar=1&LAN=DE A1 Vanga-Bouanga, C. A1 Heid, T. F. A1 David, E. A1 Frechette, M. F. A1 Savoie, S. YR 2013 SN 2334-0975 K1 Powders K1 Silicon carbide K1 Milling K1 Conductivity K1 Stress K1 Materials K1 Electric potential K1 electrical properties K1 SiC powder K1 resistivity K1 electrical field grading K1 ball milling SP 263 OP 266 LK http://dx.doi.org/https://doi.org/10.1109/EIC.2013.6554246 DO https://doi.org/10.1109/EIC.2013.6554246 SF ELIB - SuUB Bremen
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