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Failure analysis on non-visible front-end defects in deep N..:

, In: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Boon, Ang Ghim ; Chen, Changqing ; Zhao, Si Ping... - p. 177-181 , 2013
Link: https://doi.org/10.1109/IPFA.2013.6599149