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Oxygen induced limitation on grain growth in RF sputtered I..:

, In: IEEE International Conference on Electro-Information Technology , EIT 2013,
Lamsal, Buddhi Sagar ; Huh, Yung ; Dubey, Mukul... - p. 1-4 , 2013
Link: https://doi.org/10.1109/EIT.2013.6632655