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1
Study of point defects in ns pulsed-laser annealed CuInSe2 ..:
, In:
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2
,
Bhatia, A
;
Meadows, H
;
Hymas, M C
... - p. 1-5 , 2012
Link:
https://doi.org/10.1109/PVSC-Vol2.2012.6656702
RT T1
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2
: T1
Study of point defects in ns pulsed-laser annealed CuInSe2 thin films
UL https://suche.suub.uni-bremen.de/peid=ieee-6656702&Exemplar=1&LAN=DE A1 Bhatia, A A1 Meadows, H A1 Hymas, M C A1 Smith, E M A1 Dale, P J A1 Scarpulla, M A YR 2012 K1 Annealing K1 Spectroscopy K1 Programmable logic arrays K1 Impedance K1 Films K1 Atomic measurements K1 Schottky diodes K1 CuInSe2 K1 admittance spectroscopy K1 impedance spectroscopy SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/PVSC-Vol2.2012.6656702 DO https://doi.org/10.1109/PVSC-Vol2.2012.6656702 SF ELIB - SuUB Bremen
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