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Novel free-carrier pump-probe analysis of carrier transport..:
, In:
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2
,
Ahrenkiel, R. K.
;
Feldman, A.
;
Lehman, J.
. - p. 1-5 , 2012
Link:
https://doi.org/10.1109/PVSC-Vol2.2012.6656722
RT T1 <cTitle>2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2</cTitle>: T1 <Title>Novel free-carrier pump-probe analysis of carrier transport in semiconductors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-6656722&Exemplar=1&LAN=DE A1 Ahrenkiel, R. K. A1 Feldman, A. A1 Lehman, J. A1 Johnston, S. W. YR 2012 K1 Semiconductor device measurement K1 Laser excitation K1 Transient analysis K1 Absorption K1 Materials K1 Probes K1 Photoconductivity K1 Charge-carrier lifetime K1 free carrier absorption K1 photoconductive decay SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/PVSC-Vol2.2012.6656722 DO https://doi.org/10.1109/PVSC-Vol2.2012.6656722 SF ELIB - SuUB Bremen
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