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1 Ergebnisse
1
Electrical and photonic I/O test and debug:
, In:
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference
,
Li, Mike
;
Yamaguchi, Takahiro J.
- p. 1-2 , 2013
Link:
https://doi.org/10.1109/CICC.2013.6658558
RT T1
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference
: T1
Electrical and photonic I/O test and debug
UL https://suche.suub.uni-bremen.de/peid=ieee-6658558&Exemplar=1&LAN=DE A1 Li, Mike A1 Yamaguchi, Takahiro J. YR 2013 SN 0886-5930 SN 2152-3630 K1 Photonics K1 CMOS integrated circuits K1 Optical transmitters K1 Receivers K1 Through-silicon vias K1 Delays K1 Jitter SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/CICC.2013.6658558 DO https://doi.org/10.1109/CICC.2013.6658558 SF ELIB - SuUB Bremen
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