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1 Ergebnisse
1
CMOS Process Monitor:
, In:
Proceedings of the IEEE International Conference on Microelectronic Test Structures
,
Buehler, M.G.
;
Linholm, L.W.
;
Tyree, V.C.
... - p. 164,165,166,167,168 , 1988
Link:
https://doi.org/10.1109/ICMTS.1988.672954
RT T1
Proceedings of the IEEE International Conference on Microelectronic Test Structures
: T1
CMOS Process Monitor
UL https://suche.suub.uni-bremen.de/peid=ieee-672954&Exemplar=1&LAN=DE A1 Buehler, M.G. A1 Linholm, L.W. A1 Tyree, V.C. A1 Allen, R.A. A1 Blaes, B.R. A1 Jennings, G.A. A1 Hicks, K.A. YR 1988 K1 CMOS process K1 Circuit testing K1 Software testing K1 Condition monitoring K1 Algorithm design and analysis K1 Propulsion K1 Laboratories K1 CMOS technology K1 Integrated circuit testing K1 Microelectronics SP 164,165,166,167,168 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS.1988.672954 DO https://doi.org/10.1109/ICMTS.1988.672954 SF ELIB - SuUB Bremen
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