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1 Ergebnisse
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Design and evaluation of fine-grained power-gating for embe..:
, In:
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Kondo, Masaaki
;
Kobyashi, Hiroaki
;
Sakamoto, Ryuichi
... - p. 1-6 , 2014
Link:
https://doi.org/10.7873/DATE.2014.158
RT T1 <cTitle>2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Design and evaluation of fine-grained power-gating for embedded microprocessors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-6800359&Exemplar=1&LAN=DE A1 Kondo, Masaaki A1 Kobyashi, Hiroaki A1 Sakamoto, Ryuichi A1 Wada, Motoki A1 Tsukamoto, Jun A1 Namiki, Mitaro A1 Wang, Weihan A1 Amano, Hideharu A1 Matsunaga, Kensaku A1 Kudo, Masaru A1 Usami, Kimiyoshi A1 Komoda, Toshiya A1 Nakamura, Hiroshi YR 2014 SN 1530-1591 SN 1558-1101 K1 Power demand K1 Microprocessors K1 Switches K1 Leakage currents K1 Hardware K1 Switching circuits K1 Transistors SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.7873/DATE.2014.158 DO https://doi.org/10.7873/DATE.2014.158 SF ELIB - SuUB Bremen
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